ASML builds lithography systems—not finished chips
An EUV system coordinates a light source, reflective optics, masks, precision stages, vacuum and metrology.

EUV system elements
| Element | Function |
|---|---|
| EUV light source | Produces extreme ultraviolet light at a wavelength of 13.5 nm. |
| Collector and mirrors | Guide and focus light inside a vacuum environment. |
| Reticle | Carries the circuit pattern for the selected layer. |
| Projection optics | Reduce and project the pattern onto the wafer. |
| Wafer stage | Positions the wafer with extremely high precision. |
| Metrology and control | Measure alignment and correct errors throughout exposure. |
High-NA EUV
High-NA EUV systems use a numerical aperture of 0.55 to support finer patterning for future advanced logic and memory manufacturing.